ImageIR 9100 Key Benefits:
- High-resolution SWIR imaging with 1,280 × 1,024 detector format for precise detail capture
- Wide temperature measurement range from ~300 °C up to 1,700 °C
- Radiometric calibration and HighSense function for stable measurement accuracy even when changing integration parameters
- Compact, lightweight design, ideal for integration into existing systems
- Snapshot image acquisition with flexible frame rates and window mode
- No mechanical cooler required, enabling reliable, low-maintenance continuous operation
Ideal Solution For:
- High-temperature industrial processes, such as hot forming, heat treatments, welding, and forging
- Metal industry inspection for temperature profiling and quality assurance
- Additive manufacturing and laser process monitoring
- Ceramics and glass production monitoring high-temperature gradients
- Signature recognition and thermal evaluation in research
Technical Specifications
Specification |
ImageIR 9100 |
| Spectral Range | 0.9 - 1.7 µm |
| Pixel Pitch | 5 µm |
| Detector | InGaAs |
| Detector Format | 1,280 x 1,024 pixels |
| Image Recording Principle | Snapshot |
| Readout Mode | ITR/IWR |
| Aperture Ratio | F/2.2 or F/3.0 |
| Temperature Measurement Range | 300 - 850°C, up to 1,700°C |
| Measurement Accuracy | +/-1°C or +/-1% |
| Temperature Resolution at 30°C | Better than1 K (Temp resolution at 350 to 1,000°C) |
| Frame Rate (Full/Half/Quarter/Sub) | Up to 83 / 181 / 341 / 2,262 Hz |
| Window Mode | Yes |
| Focus | Manual |
| Dynamic Range | Up to 12 bit |
| Integration Time | 21 - 20,000 µs, visual up to 10 s |
| Picture Synchronization | External Trigger |
| Interfaces | GigE Vision |
| Protection level | IP40 |
| Dimensions, Weight | 78 x 55 x 55 mm; 350 g (without lens) |